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Digital Electronics - Memory and Storage

Exercise : Memory and Storage - Filling the Blanks
1.
Assume a ROM to be tested is compared with a known good ROM. If the checksums differ, the ROM is ________.
very likely to be good
definitely good
very likely to be bad
definitely bad
Answer: Option
Explanation:
No answer description is available. Let's discuss.
2.
The checkerboard pattern test is used to test ________.
ROM
EEPROM
FPLA
RAM
Answer: Option
Explanation:
No answer description is available. Let's discuss.
3.
Information that is stored in an EEPROM ________.
can be modified by performing a memory write operation
is stored by the manufacturer and cannot be changed
is lost if power is interrupted
can be erased by applying high voltage to each storage location
Answer: Option
Explanation:
No answer description is available. Let's discuss.
4.
The difference between RAM and ROM is that ________.
RAM has a read/write signal and ROM doesn't
RAM will lose data when the power is removed and ROM won't
RAM has random address access and ROM uses sequential address access
RAM has a read/write signal and ROM doesn't; RAM will lose data when the power is removed and ROM won't.
All of the above
Answer: Option
Explanation:
No answer description is available. Let's discuss.
5.
The TMS44100 has ________ address inputs.
10
11
12
13
Answer: Option
Explanation:
No answer description is available. Let's discuss.
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